AI plays a role in improving defect capture rate and distinguishing between yield-killing and nuisance defects. New developments in wafer edge inspection are proving essential to bonded wafer yields.
Abstract: This paper presents BAM-Net, a hardware-efficient binarization algorithm designed for associative memory (AM) implementation. BAM-Net aims to reduce memory overhead, power consumption, and ...
Abstract: Ultra high definition television (UHDTV) imposes extremely high throughput requirement on video encoders based on High Efficiency Video Coding (H.265/HEVC) and Advanced Video Coding ...
Altmetric provides a collated score for online attention across various platforms and media. See more details Elucidating the neuronal circuits that govern appetite requires a detailed analysis of the ...
Robert Haase, Loic Alain Royer, Peter Steinbach, Deborah Schmidt, Alexandr Dibrov, Uwe Schmidt, Martin Weigert, Nicola Maghelli, Pavel Tomancak, Florian Jug, Eugene W Myers. CLIJ: GPU-accelerated ...
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The Supporting Information is available free of charge on the ACS Publications website at DOI: 10.1021/acsphotonics.9b00706. Further details on the numerical framework, the implementation of the ...
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